The Bruker DektakXT® stylus surface profiler is an advanced thin and thick film step height measurement tool.
This system can profile surface topography and waviness, as well as roughness, to the nanometer range.
In addition to taking two-dimensional surface profile measurements, the DektakXT system can produce three-dimensional measurements and analyses with the 3D Mapping option.
The stylus force range is from 1 mg to 15 mg which allows profiling on soft or hard surfaces. The system uses a standard stylus with 12.5 um radius.
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