JEOL IB-19520CCP Cross Section Polisher is a specimen preparation device for SEM utilizing a broad Ar ion beam. The instrument is equipped with a specimen cooling system using liquid nitrogen, making it possible to prepare a cross-section specimen with minimal thermal damage. The CCP is also equipped with an air isolation system for preparation of air sensitive specimens.
Main Specs:
•Gas: Argon gas
•Accelerating voltage: 2 to 8 kV.
•Ion beam width: 500 μm (full width at half maximum)
•Maximum specimen size: 11mm(W)×8mm(D)×3mm(H)
•Milling speed: 500 μm/h (accelerating voltage 8kV).
•Specimen holder ultimate cooling temperature: –120 ℃℃ or less.