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Tanguy Terlier, Ph.D. is a Research Scientist and Principal Investigator within the Shared Equipment Authority at Rice University, where he leads advanced surface and interface characterization efforts with a strong emphasis on Secondary Ion Mass Spectrometry (SIMS) and correlative microscopy. He is also an Adjunct Professor in the Department of Chemical and Biomolecular Engineering and currently serves as Lead Project Engineer for the Woodside–Rice Decarbonization Accelerator, a strategic partnership focused on scalable decarbonization technologies.
Dr. Terlier received his Ph.D. in Materials Science and Surface Analysis from Claude Bernard University of Lyon, following academic training in physics, nanoscience, and industrial systems management in France. His doctoral research at CEA-Leti Grenoble focused on ToF-SIMS characterization of organic multilayers for electronic applications. He subsequently held a postdoctoral appointment at the Korean Institute of Science and Technology (KIST), where he contributed to advanced structure and surface characterization platforms and developed patented SIMS-based analytical methodologies.
At Rice University, Dr. Terlier oversees state-of-the-art ion beam and scanning probe instrumentation, including ToF-SIMS, operando SIMS, AFM/SPM, and correlative imaging workflows. His research spans surface and interface chemistry, polymer and hybrid materials, energy storage and conversion systems, plasma catalysis, and biointerfaces. He has particular expertise in 2D/3D chemical imaging, depth profiling, Monte Carlo modeling, and data-driven SIMS analysis, and has pioneered operando and multiplexed SIMS approaches for complex materials systems.
Dr. Terlier has authored more than 100 peer-reviewed publications in leading journals such as Science, Nature Energy, Advanced Materials, ACS Nano, and Analytical Chemistry, and has contributed a book chapter on SIMS analysis of polymer materials. His work has resulted in multiple U.S. and international patent applications related to plasma chemistry, 3D chemical imaging, and SIMS-based analytical methods. He is a frequently invited speaker at international conferences and workshops in surface science and mass spectrometry.
In addition to his research activities, Dr. Terlier is deeply engaged in teaching, mentoring, and professional service. He regularly lectures in nanoimaging, surface analysis, and nanomaterials courses and has mentored graduate students, postdoctoral researchers, and undergraduate interns across chemistry, chemical engineering, and materials science. He currently serves as Chair of the AVS Applied Surface Science Division, is an elected member of its Executive Committee, and represents the United States on the ISO Technical Committee for Surface Chemical Analysis. He is also a co-founder and leader of the revitalized North American SIMS Society.
Education
2015 PhD in Surface & Interface Analysis and Materials Science, Claude Bernard University, Lyon, France
2012 M.S. in Nanoscience & Nanotechnologies, University of Grenoble Alps, France
2012 Engineer degree in engineering of micro & nanostructures, University of Grenoble Alps, France
2010 B.S. in Physics, University of Avignon, France
Societies & Organizations
Founder and Vice-President of North America SIMS Society
Member, American Vacuum Society, Applied Surface Science division
Member, International Standard Organization TC 201
Member, American Society for Testing and Material